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Advanced
3D graphics for microscopy
With advances of the nanotechnology the needs for accurate
data measurement becoming more and more important. The nano-industry
demand for accurate characterization of the materials under
investigation and production has resulted in creation of the
brand new research area called nanometrology. Nanometrology
can be defined as science of the dimensional measurement on
the nanometer scale. Successful data analysis for nanometrology
implies both good instrument and data processing software.
Visualization
of the data is one of the most important tasks of the data
processing. While AFM/STM instruments
have been significantly improved in accuracy during last several
years, the visualization used by most of the researchers remains
more or less the same for many years. In many cases the software
is the limiting factor when detailed data analysis is required,
which is in fact abnormal situation.
See comparison of standard and advanced visualization here.
The advantage of the modern 3D graphics for microscopy is
especially big when multiple data sets should be analyzed
together in interrelation to each other. See Multilayer
AFM Samples.
ScienceGL offers data visualization and analysis software
for various types of microscopes. The software is designed
as a virtual reality 3D screen that brings the nanoworld to
your for exploration. The 3D representation of the measured
image as live real time interactive surface helps to analyze
data in most natural and intuitive way.
The software features our unique set of 3D interactive measuring
tools such as markers, intersection planes, volume, mouse
XYZ position read out, distance measurement, range of interest
(ROI) selection. Main parameters of the surface is returned
as reports for the whole data set or within specific tool.
Our single surface analyzing
package offers advanced yet affordable scientific graphics
for professional scientists and students.
The software is
available as end user solution and component for developers.
Related:
Multiple Surface3D PRO
Gallery 3D
Multilayer AFM
Samples
3D AFM Software Help
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Features |
| OpenGL
based, fast real-time render |
| Optimized
compression algorithm for large data sets |
| Animation,
real time (up to 50 fps) |
| Mouse
drag controlled rotation |
| Interactive
orthogonal cut planes |
| 1D cut
plot (surface/plane intersections) |
| Interactive
mouse operating measurement tools:XYZ
distances, area, volume, etc. |
| Range
of interest (ROI) selection tool |
| Multiple
3D markers (pins) |
| Mouse
position XYZ read out |
| Predefined
and user defined palettes, built in palette construction |
| Light
control, position and intensity |
| Independent
Zoom in all XYZ directions |
| Multiple
3D labels: selectable color, position, orientation |
| Contour
plots |
| Data
Table (Excel compatible) |
| Custom
input file formats support |
| True
3D XYZ axis, user format or auto formatted. Scalable captions,
labels, grids |
| Rendering
modes: polygons, lines (wires), dots |
| Random
Point (XYZ) support: fast Delaunay, triangulator, structured
grid generator |
| Vector
surface support |
| Flyby |
| Flexible
output JPG, BMP, AVI |
| Automation
with ActiveX |
| AutoCAD
DXF layer |
| Textures
support |
| Leveling
of second order, Advanced leveling |
| Stereo
Quad Buffer support with OpenGL aware hardware, Stereo
markers. |
| Stereo
XYZ,W mouse support |
| Multilayer
surfaces |
| True
RGBA palette |
| Vector
lines support |
| Scalar
color for each pixel (data point) |
| Stereo
XYZ,W mouse support |
| Environments:
VC++, C#, VB.NET, VB, Delphi, Excel, LabView |
| OS:
Win NT/95/98/ME/2000/XP |
| Applications
by field |
| Atomic
force, Kelvin probe, magnetic force Microscopy, AFM, KPM,
MFM |
| Scanning
tunneling microscopy, STM |
| Scanning
probe microscopy, SPM |
| Dimensional
metrology, Surface
metrology |
| Surface
analysis and characterization |
| Nanometrology,
nanotechnology |
| Scanning
Near Field Optical microscopy, SNOM, NSOM |
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| Visualization
is the Art of Science |
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| Measurements
with interactive 3D tools |
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| Quick
solutions, more productivity for developers |
| New
vision and more ideas for scientists |
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