Semiconductor Integrated Circuit
3D visualization of a surface measured with an atomic force microscope
 
The AFM measured height data is visualized with 3D AFM/SPM software .
The height of the features is exaggerated for better perception of the fine structures measured at the sample.


With Distance and Volume measuring tools
Visualized with   .:3D AFM/SPM control:.
Visualized with   .:3D AFM/SPM control:.

Elevation contour 

Related:
Single AFM surface
Multiple Surface PRO samples

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